Probing and Metrology Systems

Probing and Metrology Systems

InsituTec offers gauging products and solutions which provide unique capabilities for quality inspection on both the macroscale and microscale.  Our premier products, the AccuSurf gauge accompanied by the MicroTouch Sensor extends the functionality of a CMM to enable microscale form measurements, nanoscale surface metrology, and roundness measurements. 

Performance specifications such as throughput, part integrity, clearance issues, and data collection rates are defined by the gauging or probing technology, the scan speed, scan force, probe aspect ratio, and the dynamic response of the probing system.  InSituTec has unique probing technologies to enhance CMM capabilities Click on the category of choice to learn more.


Active Guage Heads

AccuSurf 3D AccuSurf 3D
Ultra precision multi-axis gauge head with rotary axis and up to 3 axis active force control for 3D scanning.

Passive Gauge Heads

PreCess 2D PreCess 2D
The PreCess gauging technology enables affordable high speed inspection of dimensional parts in precision manufacturing with accuracies better than 50 nanometers.

Probing Force Sensors

MicroTouch MicroTouch
A novel microscale force sensor capble of extracting surface finish and form in the same data set.